Desorption–ionization on silicon mass spectrometry: an application in forensics
- 9 August 2001
- journal article
- Published by Elsevier in Analytica Chimica Acta
- Vol. 442 (2) , 183-190
- https://doi.org/10.1016/s0003-2670(01)01107-2
Abstract
No abstract availableKeywords
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