Schottky diode with cutoff frequency of 400 GHz fabricated in 0.18 µm CMOS
- 14 April 2005
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 41 (8) , 506-508
- https://doi.org/10.1049/el:20050282
Abstract
TiSi2-Si Schottky diodes for RF rectification were fabricated using a 0.18 µm CMOS process without any process modifications. These diodes are intended to be used with forward bias and small-signal amplitude. At 0 V bias, the diodes with an area of 0.45×0.45 µm2 achieve a cutoff frequency of over 400 GHz. This is the highest cutoff frequency compared to that for the previously reported Schottky diodes fabricated in foundry CMOS processes. The turn-on voltage of the diodes is ∼0.30 V.Keywords
This publication has 4 references indexed in Scilit:
- SIMMWIC rectennas on high-resistivity silicon and CMOS compatibilityIEEE Transactions on Microwave Theory and Techniques, 1998
- CMOS foundry implementation of Schottky diodes for RF detectionIEEE Transactions on Electron Devices, 1996
- Physics of Semiconductor DevicesPhysics Today, 1990
- Metal-Semiconductor Schottky Barrier Junctions and Their ApplicationsPublished by Springer Nature ,1984