Sensitivity factors, cross-section and resolution data for use with the Si Kα X-ray source
- 31 December 1980
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 19 (3) , 409-428
- https://doi.org/10.1016/0368-2048(80)80062-4
Abstract
No abstract availableKeywords
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