Low‐Temperature Ionic Conductivity of 9.4‐mol%‐Yttria‐Stabilized Zirconia Single Crystals

Abstract
Direct current and alternating current electrical conductivity measurements are used to determine the activation energies for the formation of oxygen vacancies by breakup of bound defect complexes (0.32 eV) and their migration (0.84 eV) at low temperatures (2O3‐fully‐stabilized ZrO2 single crystals. The defect clusters break up between 360° and 450°C.