Study of the features of PSTM images by means of a perturbative approach
- 28 February 1995
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 57 (2-3) , 246-250
- https://doi.org/10.1016/0304-3991(94)00147-f
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Application of Mie Scattering of Evanescent Waves to Scanning Tunnelling Optical Microscopy TheoryJournal of Modern Optics, 1993
- Diffraction of electromagnetic waves by crossed gratings: a series solutionOptics Letters, 1992
- Analysis of photon scanning tunneling microscope imagesJournal of Applied Physics, 1992
- Sisyphus cooling of a bound atomJournal of the Optical Society of America B, 1992
- Scattering of s-polarized electromagnetic waves by a 2d obstacle near an interfaceOptics Communications, 1989
- Scattering of electromagnetic waves by rough dielectric surfacesPhysical Review B, 1988