Adaptation of the Fundamental Parameters Monte Carlo Simulation to EDXRF Analysis with Secondary Fluorescer X-Ray Machines
- 1 January 1977
- journal article
- Published by Cambridge University Press (CUP) in Advances in X-ray Analysis
- Vol. 21, 129-142
- https://doi.org/10.1154/s0376030800015214
Abstract
The Monte Carlo simulation method that has been previously developed and demonstrated for EDXRF analysis with annular radioisotope excitation sources is extended to systems using secondary fluorescer X-ray machines for excitation. Comparisons of the Monte Carlo predictions with experimental results indicate that the modification is valid.Keywords
This publication has 2 references indexed in Scilit:
- Monte Carlo Simulation of Self-Absorption Effects in Elemental XRF Analysis of Atmospheric Particulates Collected on FiltersAdvances in X-ray Analysis, 1975
- Self Absorption Corrections for X-Ray Fluorescence Analysis of AerosolsAdvances in X-ray Analysis, 1974