Ordinary and extraordinary refractive indices for AlxGa1−xN epitaxial layers
- 5 July 1999
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 75 (1) , 67-69
- https://doi.org/10.1063/1.124278
Abstract
Dispersion of the ordinary and extraordinary indices of refraction for wurtzite AlxGa1−xN epitaxial layers with x=0.00, 0.04, 0.08, 0.11, and 0.20 in the range of wavelengths 457<λ<980 nm were measured via a prism-coupled waveguide technique. The quantitative accuracy of x is ±10% and the accuracy of the refractive indices is ∼±0.01. The dispersion is found to be well described by a 1st-order Sellmeier dispersion formula. A simple functional form is presented that allows calculation of the refractive indices as functions of x and λ.Keywords
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