End-on viewed inductively coupled plasma for the determination of trace impurities in high-purity scandium oxide by extraction chromatography
- 15 July 1993
- journal article
- Published by Elsevier in Analytica Chimica Acta
- Vol. 279 (2) , 261-272
- https://doi.org/10.1016/0003-2670(93)80325-f
Abstract
No abstract availableKeywords
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