An atomic force microscope (AFM) can image surfaces of conductors, insulators, and even organic materials. Images of highly oriented pyrolytic graphite show atomic structure with a corrugation height of 0.03 nm. Images of the ‘‘native oxide’’ layer grown in ambient pressure on a (111) facet on a (100) silicon wafer show steps. Images of the native oxide layer on a (111) silicon wafer show features 0.6 nm apart and aligned with the silicon substrate. The images shown here were obtained with an instrument that can also operate as a scanning tunneling microscope (STM); it is an AFM/STM.