Interface roughness cross-correlation laws deduced from scattering diagram measurements on optical multilayers: effect of the material grain size
- 1 July 1987
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America B
- Vol. 4 (7) , 1087-1093
- https://doi.org/10.1364/josab.4.001087
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 8 references indexed in Scilit:
- Theory and application of antiscattering single layers: antiscattering antireflection coatingsApplied Optics, 1986
- Characterizations of optical surfaces by measurement of scattering distributionApplied Optics, 1984
- Antiscattering transparent monolayers: theory and experimentJournal of the Optical Society of America A, 1984
- Scattering from multilayer thin films: theory and experimentJournal of the Optical Society of America, 1981
- Light scattering from multilayer optics: comparison of theory and experimentApplied Optics, 1980
- Relation between the angular dependence of scattering and the statistical properties of optical surfacesJournal of the Optical Society of America, 1979
- Light scattering investigation of the nature of polished glass surfacesNouvelle Revue d'Optique, 1976
- Relation Between Surface Roughness and Specular Reflectance at Normal IncidenceJournal of the Optical Society of America, 1961