Characterization of misfit dislocations in epitaxial (001)-oriented TiN, NbN, VN, and (Ti,Nb) N film heterostructures by transmission electron microscopy
- 1 January 1994
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 135 (1-2) , 309-317
- https://doi.org/10.1016/0022-0248(94)90757-9
Abstract
No abstract availableKeywords
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