The Application of Scanning Auger Microscopy to the Surface Characterization of RuO2 ‐ TiO2 Coated Titanium Electrodes
- 1 April 1993
- journal article
- Published by The Electrochemical Society in Journal of the Electrochemical Society
- Vol. 140 (4) , 966-969
- https://doi.org/10.1149/1.2056236
Abstract
Scanning Auger microscopy (SAM) has been used to investigate the surface composition of coated titanium electrodes. The results of SAM measurements indicate that the segregation of occurred at the surface reflecting the morphology observed with SEM. The Auger peak of Ru at 273 eV can be determined under no influence of carbon contamination at 272 eV by microfocusing the SAM. The SAM method is valuable in monitoring the surface composition of oxide electrodes.Keywords
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