Orientation imaging microscopy: application to the measurement of grain boundary structure
- 1 July 1993
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 166 (1-2) , 59-66
- https://doi.org/10.1016/0921-5093(93)90310-b
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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