Scintillation Characteristics of Thin NaI(Tl) and CsI (Tl) Layers Fabricated by Vacuum Deposition
- 1 June 1968
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 15 (3) , 147-152
- https://doi.org/10.1109/tns.1968.4324930
Abstract
The scintillation characteristics of thin vacuum-deposited layers of NaI (Tl) and CsI (Tl) were investigated. Scintillation layers with thicknesses ranging from 0.2 to 20 mg/cm2 were evaluated as detectors with 6- and 22-keV x rays. In this energy region they were found to be comparable in performance to the thicker, commercially available NaI (Tl) and CsI (Tl) scintillation crystals. Fabrication methods, scintillator evaluation techniques, and applications in selective low-energy x-ray detection will be reported.Keywords
This publication has 2 references indexed in Scilit:
- Fabrication of thin NaI(TI) scintillation layers for low energy X-ray detectionNuclear Instruments and Methods, 1967
- The Luminescent Decay of Various Crystals for Particles of Different Ionization DensityProceedings of the Physical Society, 1961