Analysis of Optical- and Inelastic-Electron-Scattering Data III Reflectance Data for Beryllium, Germanium, Antimony, and Bismuth

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Abstract
A procedure is described for simultaneously fitting reflectance data obtained for various photon energies and angles of incidence using a simple physical model for ∊(ω), the complex frequency-dependent dielectric constant. The mutual consistency of the model and of the experimental data is tested, within the accuracy of each measurement. As an example of the technique, reflectance data in the vacuum ultraviolet obtained by Toots, Fowler, and Marton for Be, Ge, Sb, and Bi have been satisfactorily fitted. The model parameters have been used to derive the optical constants n and k (in satisfactory agreement with conventional determinations) and can be readily related to other relevant experimental results or theoretical calculations of ∊(ω) if these are available.

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