Focusing of Intense Ion Beams from Pinched-Beam Diodes
- 5 June 1978
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 40 (23) , 1504-1507
- https://doi.org/10.1103/physrevlett.40.1504
Abstract
Geometric focusing of proton and deuteron beams extracted from pinched-beam diodes to current densities above 70 kA/ is demonstrated by a variety of experimental techniques. Time-dependent computer simulations of the electron and ion flow show good agreement with experiment.
Keywords
This publication has 7 references indexed in Scilit:
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- Diagnostics for intense pulsed ion beamsReview of Scientific Instruments, 1977
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- Two-dimensional ion effects in relativistic diodesJournal of Vacuum Science and Technology, 1975
- Ion-Induced Pinch and the Enhancement of Ion Current by Pinched Electron Flow in Relativistic DiodesPhysical Review Letters, 1975