Diagnostic X-ray spectra measurements using a silicon surface barrier detector

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Abstract
A silicon surface barrier detector is used to analyse diagnostic X-ray spectra. This detector, usually employed to detect charged particles, has a very low efficiency for X-ray. This characteristic is advantageous in overcoming experimental problems caused by the high fluence rates typical of diagnostic X-ray beams. The pulse height distribution obtained with silicon surface barrier detectors is very different from the true photon spectra because of the presence of escaped Compton photons and the fact that detection efficiency falls abruptly when photon energy increases. A detailed analysis of the spurious effects involved in detection is made by applying a Monte Carlo method. A stripping procedure is described for implementation on a personal computer. The validity of this method is finally tested by comparison with the experimental results obtained with a Ge detector. The spectra obtained with the Si detector are in fairly good agreement with the analogous spectra measured with a Ge detector. The advantages of using Si as opposed to Ge detectors in X-ray spectrometry can be summarised as: its simplicity of use, its greater economy for use in routine diagnostic X-ray spectroscopy and the possibility that the stripping procedure can be implemented on a personal computer.