Photoelastic modulated ellipsometry on magnetooptic multilayer films
- 15 November 1986
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 25 (22) , 4017-4022
- https://doi.org/10.1364/ao.25.004017
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 9 references indexed in Scilit:
- Reflectivity, rotation, and ellipticity of magnetooptic film structuresApplied Optics, 1984
- Measurement of the magnetooptic properties of bismuth-substituted iron garnet films using piezobirefringent modulationApplied Optics, 1984
- Measurement of the magnetooptical constants of reactive metalsApplied Optics, 1983
- Measurement of Magneto-Optical Kerr Effect Using Piezo-Birefringent ModulatorJapanese Journal of Applied Physics, 1981
- Magneto-optical characterization of Fe and Co-based alloy filmsJournal of Magnetism and Magnetic Materials, 1980
- A modulated ellipsometer for studying thin film optical properties and surface dynamicsSurface Science, 1973
- Variation of longitudinal kerr and faraday effects with angle of incidence in thin iron filmsIEEE Transactions on Magnetics, 1970
- Piezo-Optical Birefringence Modulators: New Use for a Long-Known EffectJournal of the Optical Society of America, 1969
- An Improved Method for High Reflectivity Ellipsometry Based on a New Polarization Modulation TechniqueReview of Scientific Instruments, 1969