Partial scan: what problem does it solve?
- 30 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- THE EFFECT OF DIFFERENT TEST SETS ON QUALITY LEVEL PREDICTION: WHEN IS 80% BETTER THAN 90%?Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Using scan technology for debug and diagnostics in a workstation environmentPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Diagnosis of Automata Failures: A Calculus and a MethodIBM Journal of Research and Development, 1966