Polysilicon thin film transistors with field-plate-induced drain junction for both high-voltage and low-voltage applications
- 4 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Comparisons of implant-through-contact and conventional high-voltage TFTsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Anomalous leakage current in LPCVD PolySilicon MOSFET'sIEEE Transactions on Electron Devices, 1985