Resistivity Measurements of Semiconductors at 9000 MC
- 1 September 1960
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IRE Transactions on Instrumentation
- Vol. I-9 (2) , 175-179
- https://doi.org/10.1109/ire-i.1960.5006911
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Measurement of Sheet Resistivities with the Four-Point ProbeBell System Technical Journal, 1958
- Resistivity Measurements on Germanium for TransistorsProceedings of the IRE, 1954