Morphological instability of bilayers of copper germanide films and amorphous germanium

• 6 November 1995
• journal article
• Published by AIP Publishing in Applied Physics Letters
• Vol. 67  (19) , 2804-2806
• https://doi.org/10.1063/1.114790

Abstract

Keywords

• THIN FILMS
• TRANSMISSION ELECTRON MICROSCOPY
• SECONDARY ION MASS SPECTROMETRY
• CRYSTALLIZATION
• COPPER
• TEMPERATURES
• SINGLE CRYSTAL
• X RAY DIFFRACTION
• SI