Analysis of polymer surfaces by SIMS. 2—fingerprint spectra from simple polymer films
- 1 August 1982
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 4 (4) , 151-155
- https://doi.org/10.1002/sia.740040405
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Characterization of polymeric thin films by low-damage secondary ion mass spectrometryApplications of Surface Science, 1981
- Static secondary ion mass spectrometry of polymer systemsAnalytical Chemistry, 1980