Atomic Force Microscopy Images of Natural Zeolite Surfaces Observed under Ambient Conditions
- 1 June 1994
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 33 (6S)
- https://doi.org/10.1143/jjap.33.3761
Abstract
Atomic force microscopy (AFM) images of the (010) faces of two natural zeolites, stilbite and heulandite, were obtained under ambient conditions. They show corrugations close to atomic resolution. For stilbite, crystallographic defects on its surface were observed for the first time. Heulandite images did not match with the surface structure expected from its bulk crystallographic data.Keywords
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