Silicon vidicon system for measuring laser intensity profiles
- 15 December 1978
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 17 (24) , 3938-3944
- https://doi.org/10.1364/ao.17.003938
Abstract
A silicon-target vidicon and minicomputer system providing rapid recording, readout, and processing of laser beam intensity profiles is described. Results are presented for 150-psec, 1064-nm neodymium laser pulses. Use of a thick, neutron-transmutation-doped silicon target reduced spatial sensitivity nonuniformities and coherent interference modulation. Modifications of commercial cameras to provide linearized output and timing control are described. The vidicon signal is recorded in a video disk recorder, digitized, and stored on a magnetic disk. Selected 1-D profiles and color isointensity whole beam profiles are available on CRT displays. Using a PDP-11 computer, the beam is analyzed to yield a peak energy flux within 100 sec after the laser pulse. The performance of the vidicon system is compared with photographic film techniques. Results show a sensitivity uniformity of ≥93% peak to peak over a target distance of 9.6 mm, linear dynamic range of ≳20, and absolute flux agreement within ±10%. The system is useful for other laser wavelengths and pulse durations as well as for nonlaser applications.Keywords
This publication has 1 reference indexed in Scilit:
- On the cooling rates of large-diameter silicon crystalsApplied Physics Letters, 1978