Abstract
Electron diffraction methods are briefly reviewed for the determination of individual grain orientations and for the measurement of SAD pole figures. The standard techniques of orientation determination grain by grain using a TEM are the interpretation of selected area electron spot and microbeam Kikuchi diffraction patterns. Electron-transparent thin samples are required. Specimen regions smaller than 500 nm or 10 nm in diameter, respectively, can be studied. Alternatively, quantitative pole figures can be measured using a TEM from selected areas down to 0.5 μm in diameter.

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