The determination of surface composition profiles in glass by Auger electron spectroscopy and ion etching
- 1 October 1977
- journal article
- Published by Springer Nature in Journal of Materials Science
- Vol. 12 (10) , 2001-2010
- https://doi.org/10.1007/bf00561972
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- AES compositional profiles of mobile ions in the surface region of glassJournal of Vacuum Science and Technology, 1976
- Glass surface analysis by Auger Electron SpectroscopyJournal of Non-Crystalline Solids, 1975
- Ion beam etchingPhysics in Technology, 1974
- Auger electron spectroscopy for thin film analysisJournal of Crystal Growth, 1972
- Element Profiles across Thin Oxide FilmsNature Physical Science, 1972
- Sputtering Studies of Insulators by Means of Langmuir ProbesJournal of Applied Physics, 1965