Dependence of interface state density on the atomic roughness at the Si — SiO2 interface
- 1 July 1984
- journal article
- Published by Elsevier in Surface Science
- Vol. 142 (1-3) , 545-555
- https://doi.org/10.1016/0039-6028(84)90361-3
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
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