Perspective of scaled bipolar devices

• 1 January 1981
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• https://doi.org/10.1109/iedm.1981.190132

Abstract

Keywords

• NUMERICAL ANALYSIS
• IMPURITIES
• PREDICTIVE MODELS
• DOPING
• PHOTONIC BAND GAP
• BREAKDOWN VOLTAGE
• 2 DIMENSIONAL
• VERY LARGE SCALE INTEGRATION
• CONDUCTIVITY