Characterization of high-quality NTCDA films on metal substrates
- 1 November 1998
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 96 (1-3) , 11-17
- https://doi.org/10.1016/s0368-2048(98)00246-1
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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