F‐Aggregate Center Formation at Low Temperatures in KCl

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Abstract
Measurements of the F‐center concentration, nF, and M‐center concentration, nM, for KCl samples irradiated with 1.5 MeV electrons at low temperatures show that the ratio nM/nF2 for electron irradiation is only one‐half that found previously for X‐ray irradiated crystals. The electron results are in appreciably better agreement with the value to be expected from a statistical model and an M‐band oscillator strength obtained by optical bleaching techniques. The discrepancy between the electron irradiation and X‐ray irradiation results is discussed and it is concluded that the statistical model, according to which an M‐center appears whenever two F‐centers are produced at adjacent sites, may not be adequate to describe F‐ and M‐center introduction at low temperature.

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