Can charge writing aid nanotechnological manipulation?
- 1 June 1998
- journal article
- Published by IOP Publishing in Nanotechnology
- Vol. 9 (2) , 133-142
- https://doi.org/10.1088/0957-4484/9/2/016
Abstract
Significant progress in the examination or manipulation of submicrometre particles and large molecules is likely to be dependent upon a suitable method in locating and orienting them onto working substrates. Ideally this would be a general purpose tool that allowed local programming to attract selectively species of interest. Charge writing onto electrets with a scanning-probe microscope offers one possible method. Here the use of this technique for memory applications (the only significant body of research) is examined in order to judge the feasibility of using it with different operational parameters for `electrostatic clamping'. Until recently it was not regarded as practicable, but new materials developments, especially oxide-nitride-oxide-silicon electrets, show considerably more promise. A clear answer to our question cannot yet be given, but further investigations are suggested and recommended.Keywords
This publication has 50 references indexed in Scilit:
- Scanned Probe Microscopies in ChemistryThe Journal of Physical Chemistry, 1996
- Atomic force microscopy and scanning tunnelling microscopy: Refining techniques for studying biomoleculesTrends in Biotechnology, 1994
- The scanning tunneling microscope as a tool for nanofabricationNanotechnology, 1990
- Scanning tunneling microscope instrumentationReview of Scientific Instruments, 1989
- Scanning tunneling microscope as a micromechanical toolApplied Physics Letters, 1987
- Atomic-scale surface modifications using a tunnelling microscopeNature, 1987
- Single-tube three-dimensional scanner for scanning tunneling microscopyReview of Scientific Instruments, 1986
- Atomic Force MicroscopePhysical Review Letters, 1986
- 7 × 7 Reconstruction on Si(111) Resolved in Real SpacePhysical Review Letters, 1983
- The Topografiner: An Instrument for Measuring Surface MicrotopographyReview of Scientific Instruments, 1972