LEED I-V curve analysis for the structure of iron films on Si(111) surfaces
- 1 January 1990
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 41-42, 103-106
- https://doi.org/10.1016/0169-4332(89)90040-8
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Structures of iron films deposited on Si(111)7×7 surface studied by LEEDApplied Surface Science, 1988
- Low-energy electron diffraction analysis of the Si(111)7×7 structureJournal of Vacuum Science & Technology A, 1988
- Angle resolved ultraviolet photoelectron spectroscopy study of ultrathin iron films on Si(111) surfacesJournal of Vacuum Science & Technology A, 1987
- Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffractionSurface Science, 1985
- Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopyJournal of Vacuum Science & Technology A, 1985
- A simple method of automatic LEED spot tracingSurface Science, 1979