An investigation into the reliability of planar transistors
- 1 September 1965
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 4 (3) , 245-266
- https://doi.org/10.1016/0026-2714(65)90086-7
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Analytic Expressions Relating Surface Charge and Potential Profiles in the Space-Charge Region in SemiconductorsJournal of Applied Physics, 1963
- Quantitative Considerations Concerning Catalysis at a Semiconductor SurfaceThe Journal of Chemical Physics, 1960
- Statistics of the Recombinations of Holes and ElectronsPhysical Review B, 1952
- The Theory ofp-nJunctions in Semiconductors andp-nJunction TransistorsBell System Technical Journal, 1949