Test results on double sided readout silicon strip detectors
- 1 February 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 36 (1) , 40-45
- https://doi.org/10.1109/23.34398
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Charge collection scanning electron microscopyJournal of Applied Physics, 1982