A versatile thin film thickness monitor of high accuracy
- 1 November 1967
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 44 (11) , 917-921
- https://doi.org/10.1088/0950-7671/44/11/307
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Factors affecting the operation of the quartz oscillator gaugeVacuum, 1965
- Transistor crystal oscillators and the design of a 1-Mc/s oscillator circuit capable of good frequency stabilityRadio and Electronic Engineer, 1965
- Verwendung von Schwingquarzen zur W gung d nner Schichten und zur Mikrow gungThe European Physical Journal A, 1959
- Low Temperature Coefficient Quartz CrystalsBell System Technical Journal, 1940