A Study of Transfer Excitation in F8+ + He, Ne and Ar Collisions
- 1 April 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 30 (2) , 1002-1004
- https://doi.org/10.1109/tns.1983.4332436
Abstract
High resolution x-ray spectroscopy has been used to measure F K x rays resulting from the decay of doubly excited two electron states formed during F8+ + He, Ne, or Ar collisions. The energy range spanned by the spectrometer includes the 2s2p(3P) ⟶ 1s2s(3S), 2s2p(1P) ⟶ 1s2s(lS), 2p2(1D) ⟶ 1s2p(1P), 2p2(3P) ⟶ 1s2p(3P) and the 2p2(1S) ⟶ 1s2p(1P) transitions. These states may be formed by nonresonant transfer excitation, in which electron excitation is coupled with electron capture to an excited state, or by resonant transfer excitation, a process related to dielectronic recombination, in which the capture of a loosely bound target electron results in projectile electron excitation. Calculations have been performed to estimate the contribution of each process to the total measured cross section.Keywords
This publication has 3 references indexed in Scilit:
- Dielectronic recombination cross sections for Si11+ and S13+Physics Letters A, 1982
- Simultaneous Electron Capture and Excitation in S + Ar CollisionsPhysical Review Letters, 1981
- Target-Thickness Dependence of Radiative Electron Capture in Heavy-Ion CollisionsPhysical Review Letters, 1978