Voltage Versus Flux Relation of High Tc DC Superconducting Quantum Interference Device with Different Inductances
- 1 October 1993
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 32 (10A) , L1407
- https://doi.org/10.1143/jjap.32.l1407
Abstract
The voltage versus flux (V-Φ) relation of dc superconducting quantum interference devices (SQUIDs) in the presence of thermal noise at T=77 K is studied. A theoretical expression for the modulation voltage ΔV in the V-Φ relation is presented as a function of SQUID inductance. The theoretical expression is compared with experimental results of ΔV reported recently for high T c SQUIDs with different inductances. It is shown that experimental results agree quantitatively with theoretical ones. It is also shown that imperfection of Josephson junctions degrades the modulation voltage more significantly when the inductance increases. The dependence of the modulation voltage on the inductance clarified in the paper is useful for developing a magnetic sensor using the SQUID.Keywords
This publication has 8 references indexed in Scilit:
- Effect of thermal noise on the characteristics of a high T c superconducting quantum interference deviceJournal of Applied Physics, 1993
- Characteristics of YBCO step-edge weak links and SQUIDsIEEE Transactions on Applied Superconductivity, 1993
- Bicrystal YBCO DC SQUIDs with low noiseIEEE Transactions on Applied Superconductivity, 1993
- Noise properties of YBaCuO step edge DC-SQUIDs with different inductanceIEEE Transactions on Applied Superconductivity, 1993
- Low 1/f noise in YBa2Cu3O7 dc SQUIDs on (Y)ZrO2 bicrystal substratesApplied Physics Letters, 1992
- Flicker (1/f) noise in biepitaxial grain boundary junctions of YBa2Cu3O7−xApplied Physics Letters, 1992
- 1/f noise in superconducting bicrystal grain-boundary junctionsPhysical Review Letters, 1992
- Low noise YBa2Cu3O7−δ grain boundary junction dc SQUIDsApplied Physics Letters, 1990