Boundary scan with cellular-based built-in self-test

Publisher Website

6 January 2003

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/test.1988.207791

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Hybrid designs generating maximum-length sequences
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
LOCST: A Built-In Self-Test Technique
IEEE Design & Test of Computers, 1984