Practical Applications of Accelerated Testing - Introduction

• 1 April 1975
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE) in 8th Reliability Physics Symposium
• No. 07350791,p. 253-254
• https://doi.org/10.1109/irps.1975.362703

Abstract

Keywords

• LIFE ESTIMATION
• STRESS
• FAILURE ANALYSIS
• SILICON
• SEMICONDUCTOR DEVICES
• CIRCUIT TESTING
• TEMPERATURE
• METALLIZATION
• ELECTROMIGRATION
• DEGRADATION