Characterization of the dielectric properties of thin films
- 1 March 1985
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 125 (3-4) , 277-289
- https://doi.org/10.1016/0040-6090(85)90234-2
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- A cluster approach to the structure of imperfect materials and their relaxation spectroscopyProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1983
- Theoretical basis for the statistics of dielectric breakdownJournal of Physics C: Solid State Physics, 1983
- Dielectric Relaxation and the Structure of Condensed MatterPhysica Scripta, 1982
- The examination of correlated noiseJournal of Physics C: Solid State Physics, 1981
- Non-exponential decay in dielectrics and dynamics of correlated systemsNature, 1979
- Low-frequency dispersion in carrier-dominated dielectriPhilosophical Magazine Part B, 1978
- Characterisation of dielectric loss in solids and liquidsNature, 1978
- A new model of dielectric loss in polymersColloid and Polymer Science, 1975
- Statistical-Mechanical Theory of Irreversible Processes. I. General Theory and Simple Applications to Magnetic and Conduction ProblemsJournal of the Physics Society Japan, 1957
- Studien über die Anomalien im Verhalten der DielektrikaAnnalen der Physik, 1907