An SEU-hardened CMOS data latch design
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 35 (6) , 1682-1687
- https://doi.org/10.1109/23.25522
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Error Analysis and Prevention of Cosmic Ion-Induced Soft Errors in Static CMOS RAMsIEEE Transactions on Nuclear Science, 1982