Correlation of cryo-electron microscopic and x-ray data and compensation of the contrast transfer function
- 1 August 1992
- journal article
- Published by Cambridge University Press (CUP) in Proceedings, annual meeting, Electron Microscopy Society of America
- Vol. 50 (2) , 996-997
- https://doi.org/10.1017/s0424820100129619
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- Measurement and compensation of defocusing and aberrations by Fourier processing of electron micrographsPhilosophical Transactions of the Royal Society of London. B, Biological Sciences, 1971