A MOSFET oscillator suitable for measurements of small changes in capacitance or inductance at cryogenic temperatures
- 1 April 1972
- journal article
- Published by Elsevier in Cryogenics
- Vol. 12 (2) , 121-124
- https://doi.org/10.1016/0011-2275(72)90008-2
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Magnetic Susceptibility Measurements with a Tunnel Diode OscillatorReview of Scientific Instruments, 1970
- MOST's at cryogenic temperaturesSolid-State Electronics, 1968
- Low Frequency Field Modulation Differential Magnetometer; Applications to the De Haas-Van Alphen EffectReview of Scientific Instruments, 1965
- Observation of Oscillatory Magnetostriction in Bismuth at 4.2°KPhysical Review Letters, 1963
- The dielectric constant of liquid heliumPhysica, 1961