The Measurement of Elastic Constants for the Determination of Stresses by X-Rays
- 1 January 1983
- journal article
- Published by Cambridge University Press (CUP) in Advances in X-ray Analysis
- Vol. 27, 159-170
- https://doi.org/10.1154/s0376030800017043
Abstract
Residual and applied stresses (σij) are often measured via X-ray diffraction, by calculating the resultant elastic strains (ϵij) from the measured change in interplanar spacing (“d”). This method is non-destructive, reasonably reproducible (typically ±14 MPa), can be carried out in the field, and is readily automated to give values to an operator-specified precision , Let Lirepresent the axes of the measuring system with L3normal to the diffracting planes, and Pirepresent the sample axes. These axes are illustrated in Figure 1. In what follows, primed stresses and strains are in the laboratory system, while unprimed values are in the sample system.Keywords
This publication has 5 references indexed in Scilit:
- Residual stresses in cubic materials with orthorhombic or monoclinic specimen symmetry: influence of texture on ψ splitting and non-linear behaviourJournal of Applied Crystallography, 1983
- The influence of multiaxial stress states, stress gradients and elastic anisotropy on the evaluation of (Residual) stresses by X-raysJournal of Applied Crystallography, 1979
- “PARS”—A Portable X-Ray Analyzer for Residual StressesJournal of Testing and Evaluation, 1978
- Der Anisotropieeinfluß auf röntgenographische Gitterdehnungsmessungen an NickelThe European Physical Journal A, 1961
- Berechnung der elastischen Konstanten des Vielkristalls aus den Konstanten des EinkristallsThe European Physical Journal A, 1958