Nucleation and growth analysis of microcrystalline silicon by scanning probe microscopy: substrate dependence, local structural and electronic properties of as-grown surfaces
- 1 May 2000
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 266-269, 69-73
- https://doi.org/10.1016/s0022-3093(99)00736-x
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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