Crack propagation in a dynamic fuse model of electromigration
- 1 January 1994
- journal article
- Published by IOP Publishing in Journal of Physics A: General Physics
- Vol. 27 (2) , 327-333
- https://doi.org/10.1088/0305-4470/27/2/017
Abstract
We introduce a dynamic fuse model for the damage done to a metal thin film by electromigration, and study the growth of a single crack that is perpendicular to the direction of the ambient current. As the crack length 2x grows large, the velocity of the crack tips v scales as v(x) approximately xalpha . We argue that the value of the exponent alpha is exactly 2. This result is in excellent agreement with our numerical work.Keywords
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