A Hybrid Film Thickness Evaluation Scheme Based on Multi-Channel Interferometry and Contact Mechanics

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Abstract
A hybrid evaluation scheme for EHL film thickness determination is proposed and discussed. The film thickness profile in the contact region is measured using interferograms produced with a novel multi channel interferometry method. Since the refractive index distribution in the contact is pressure-dependent, and the initial film thickness profile will be evaluated assuming atmospheric pressure, a refractive index correction scheme is employed. The correction scheme is based on the Lorenz-Lorentz equation and a pressure-density relation together with a numerical pressure solver taking the initial film thickness measurement as input. The film thickness determination scheme is applied to an interesting phenomenon that can be observed at sliding conditions when the discrepancy occurred in the form of a deep and large dimple in the conjunction. Such a dimple appeared instead of the conventional plateau. The phenomenon was studied under different degrees of sliding. The detailed film thickness maps and pressure distributions for highly loaded EHL conjunctions at high degrees of sliding are produced using a hybrid evaluation scheme. The results are analyzed and discussed. [S0742-4787(00)00301-5]

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