Angular dependence of X‐ray fluorescence intensities

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Abstract
The x‐ray fluorescence intensity of a sample contains the product of two angular‐dependent factors: the first describes the angular dependence of the absorption of both incident and emitted radiation and the second is a geometrical factor accounting for the angular variation of irradiated and detected surface area. Theory for the angular dependence of x‐ray intensities is presented. Good agreement is found with experimental data, measured with a novel focusing spectrometer using a small silicon detector. Measurement of the angular dependence of intensities is especially promising for the analysis of multi‐layer samples.