Polarized Raman spectroscopy of chemically vapor deposited diamond films
- 31 October 1994
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 65 (18) , 2248-2250
- https://doi.org/10.1063/1.112778
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Quantitative measurement of residual biaxial stress by Raman spectroscopy in diamond grown on a Ti alloy by chemical vapor depositionPhysical Review B, 1993
- Variation of the raman diamond line shape with crystallographic orientation of isolated chemical-vapour-deposited diamond crystalsDiamond and Related Materials, 1993
- Growth-sector dependence of fine structure in the first-order Raman diamond line from large isolated chemical-vapor-deposited diamond crystalsApplied Physics Letters, 1993
- Raman scattering fromcarbon clustersPhysical Review B, 1992
- Correlation between crystalline perfection and film purity for chemically vapor deposited diamond thin films grown on fused quartz substratesJournal of Applied Physics, 1991
- Characterization of crystalline quality of diamond films by Raman spectroscopyApplied Physics Letters, 1989
- Characterization of diamond films by Raman spectroscopyJournal of Materials Research, 1989
- The Effect of High-Numerical-Aperture Objectives on Polarization Measurements in Micro-Raman SpectrometryApplied Spectroscopy, 1985